NXP Semiconductors
Table 7. Static characteristics …continued
T amb = ? 40 ° C to +85 ° C, unless otherwise specified.
LPC1111/12/13/14
Symbol
Parameter
Conditions
Min
Typ [1]
Max
Unit
I LI
input leakage current
V I = V DD(IO)
[7]
2
4
μ A
V I = 5 V
-
10
22
μ A
Oscillator pins
V i(xtal)
V o(xtal)
crystal input voltage
crystal output voltage
0
0
1.8
1.8
1.95
1.95
V
V
[1]
[2]
[3]
[4]
[5]
[6]
[7]
Typical ratings are not guaranteed. The values listed are at room temperature (25 ° C), nominal supply voltages.
Including voltage on outputs in 3-state mode.
V DD(3V3) and V DD(IO) supply voltages must be present.
3-state outputs go into 3-state mode when V DD(IO) is grounded.
Accounts for 100 mV voltage drop in all supply lines.
Allowed as long as the current limit does not exceed the maximum current allowed by the device.
To V SS .
Table 8. ADC static characteristics
T amb = ? 40 ° C to +85 ° C unless otherwise specified; ADC frequency 4.5 MHz, V DD(3V3) = 2.5 V to 3.6 V.
Symbol
V IA
C ia
E D
E L(adj)
E O
E G
E T
Parameter
analog input voltage
analog input capacitance
differential linearity error
integral non-linearity
offset error
gain error
absolute error
Conditions
[2][3][4]
[2][5]
[2][6]
[2][7]
[2][8]
Min
0
-
Typ [1]
-
-
± 1
± 1.5
± 2.5
0.5
± 3
Max
V DD(3V3)
1
-
-
-
-
-
Unit
V
pF
LSB
LSB
LSB
%
LSB
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[8]
Typical ratings are not guaranteed. The values listed are at room temperature (25 ° C), nominal supply voltages.
Conditions: V SS = 0 V, V DD (3V3) = 3.3 V.
The ADC is monotonic, there are no missing codes.
The differential linearity error (E D ) is the difference between the actual step width and the ideal step width. See Figure 7 .
The integral non-linearity (E L(adj) ) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 7 .
The offset error (E O ) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 7 .
The gain error (E G ) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 7 .
The absolute error (E T ) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated
ADC and the ideal transfer curve. See Figure 7 .
LPC1111_12_13_14_0
? NXP B.V. 2009. All rights reserved.
Objective data sheet
Rev. 00.11 — 13 November 2009
32 of 53
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